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Band Energetics

Author(s)
Shu Hu
Burton Simpson
Keywords
X-Ray Photoelectron Spectroscopy (XPS)
Valence Band Maximum (VBM)
Band Edge Positions
Core Level Binding Energy (CLBE)
Abstract

This SOP details procedures for measuring band energetics of semiconductors using XPS measurements.

AWST Technology
Photoelectrochemical (PEC)
Protocol #
PEC-P-7
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